Last edited by Mushura
Tuesday, July 21, 2020 | History

5 edition of Secondary Ion Mass Spectrometry SIMS XI found in the catalog.

Secondary Ion Mass Spectrometry SIMS XI

by Edited by: G. Gillen

  • 240 Want to read
  • 10 Currently reading

Published by Wiley .
Written in English

    Subjects:
  • Mass spectrometry,
  • Materials science,
  • Technology / General,
  • General,
  • Technology,
  • Technology & Industrial Arts,
  • Science/Mathematics

  • Edition Notes

    ContributionsG. Gillen (Editor), R. Lareau (Editor), J. Bennett (Editor), F. Stevie (Editor)
    The Physical Object
    FormatHardcover
    Number of Pages1150
    ID Numbers
    Open LibraryOL10341397M
    ISBN 100471978264
    ISBN 109780471978268

    Using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and matrix assisted laser desorption/ionization mass spectrometry (MALDI-MS) for investigations on single hair samples to solve the contamination versus incorporation issue of hair analysis in the case of cocaine and methadone†. Get this from a library! Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis. [Robert G Wilson; F A Stevie; C W Magee].

    Bombardment of a sample surface with a primary ion beam (I p) followed by mass spectrometry of the emitted secondary ions (I s) constitutes secondary ion mass spectrometry. SIMS is a surface analysis technique used to characterize the surface and sub-surface region of materials and based on m/e ratio measurement of ejected particles under ion. E() Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS) mass spectrometry data~ SIMS~.

    Large argon cluster ions can also very successfully be applied as primary ion projectiles in unique IONTOF 90° pulsing system of the gas cluster source enables the generation of short primary ion pulses for high mass resolution surface spectrometry and allows the variation of the applied cluster sizes from to atoms/cluster. Secondary ion mass spectrometry: applications for depth profiling and surface characterization Fred Stevie This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data g: SIMS XI.


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Secondary Ion Mass Spectrometry SIMS XI by Edited by: G. Gillen Download PDF EPUB FB2

This volume contains contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, September,   Description.

This volume contains contributions presented as plenary,invited and contributed poster and oral presentations at the 11thInternational Conference on Secondary Ion Mass Spectrometry (SIMSXI) held at the Hilton Hotel, Walt Disney World Village, Orlando,Florida, 7 12 September, The book covers a diverse range ofresearch, reflecting the rapid growth in Format: Hardcover.

About this book Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations.

This volume contains contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, 7 12 September, Cited by:   Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrationsPrice: $ Secondary ion mass spectrometry (SIMS) is a relatively new technique for surface chemical analysis compared with Auger electron spectroscopy (AES) and X‐ray photoelectron spectroscopy (XPS).

SIMS examines the mass of ions, instead of energy of electrons, escaped from a solid surface to obtain information on surface chemistry. This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials.

While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

Secondary ion mass spectrometry (SIMS) is a technique used to analyze compositions of thin films and surfaces by using a focused primary ion beam to sputter the surface of a sample and analyze the ejected secondary ions.

SIMS is a qualitative technique nominally but, if combined with standards, can be considered a quantitative technique. Secondary ion mass spectrometry Secondary ion mass spectrometry (SIMS) is based on the observation of charged particles (Secondary Ions) are ejected from a sample surface when bombarded by a primary beam of heavy particles.

Introduction. Problems Encountered in Depth Profiling of Nitrogen and Oxygen in Silicon by Means of Secondary Ion Mass Spectrometry W. Wach, K. Wittmaack Pages Depth Profiling of Phosphorus in Silicon Using Cesium Bombardment Negative SIMS.

The secondary ion mass spectroscope (SIMS) is one of the versatile techniques to assess the distribution of the elements in the thin film solar cell structure or absorber. The precise Ga grading helps to create back surface field (BSF) in the thin film solar cells to reduce reverse saturation current and enhance the efficiency of the cell.

Secondary Ion Mass Spectrometry relies upon the impact of an energetic ion into a surface, transferring enough energy to atoms in the surface to allow them escape and be ionized (creating the secondary ion). The process is complex to model but some simple pictures can. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis.

It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials.

While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka.

Abstract This book is the proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) held in Paris in The sections cover basics, instrumentation, quantification, ion imaging, depth profiling, organics, combined techniques, surfaces, and several applications.

References date from the s to the present. Buy and Download Individual Chapters. In the decade following the first edition of this book, TOF-SIMS: materials analysis by Mass Spectrometry has been transformed by the adoption of heavy polyatomic or cluster primary ion sources.

Lower damage rates and higher yields of analytically useful secondary ions have benefited all areas of application, especially in medical science, but the ability.

This volume contains contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI.

Dynamic SIMS Cluster Ion SIMS Hardware Vacuum Vacuum and the Kinetic Theory of Gases Pumping Systems Primary Ion Columns Ion Sources Secondary Ion Columns Mass Filters Energy Filters Detectors Summary 5. Secondary Ion Mass Spectrometry SIMS III Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5.

Secondary ion mass spectrometry (SIMS) is a useful tool in determining any of several aspects ofmore» Often used in conjunction with other surface analysis and electron microscopy methods, SIMS has been used to determine or confirm reactions on and in particles, the presence of particular organic species on the surface of atmospheric aerosols.

As a class, SIMS instruments (aka ion microprobes) use an internally generated beam of either positive (e.g., Cs) or negative (e.g., O) ions (primary beam) focused on a sample surface to generate ions that are then transferred into a mass spectrometer across a high electrostatic potential, and are referred to as secondary ions.Save the date!

We are pleased to announce the 24 th International Conference on Secondary Ion Mass Spectrometry – SIMS which will be held in La Rochelle (France), from 10 to 15 September The conference will be the occasion for colleagues from both academia and industries to exchange results and news on Secondary Ion Mass Spectrometry and related techniques.